The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2011

Filed:

Jun. 09, 2008
Applicants:

Sridhar Ranganathan, Suwanee, GA (US);

Andrew Thomas Baker, Norcross, GA (US);

Ralph Andrew Solarski, Alpharetta, GA (US);

Joel P. Anderson, Appleton, WI (US);

Jeanne Marie Gatto, Alpharetta, GA (US);

Jeff Heller, Neenah, WI (US);

Inventors:

Sridhar Ranganathan, Suwanee, GA (US);

Andrew Thomas Baker, Norcross, GA (US);

Ralph Andrew Solarski, Alpharetta, GA (US);

Joel P. Anderson, Appleton, WI (US);

Jeanne Marie Gatto, Alpharetta, GA (US);

Jeff Heller, Neenah, WI (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); G01K 17/00 (2006.01); G01K 3/00 (2006.01); G01K 1/02 (2006.01); G01K 5/70 (2006.01); G01K 5/00 (2006.01); G01K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and device for monitoring thermal stress in a user is described. The device is designed to include a material having specific thermodynamic properties and physical dimensions defined as a function of those thermodynamic properties. A system for thermal stress monitoring including a thermal stress monitoring device configured within a garment is also described.


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