The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2011

Filed:

Aug. 04, 2008
Applicants:

Hao Luan, Plano, TX (US);

Steve P. Korson, Murphy, TX (US);

Inventors:

Hao Luan, Plano, TX (US);

Steve P. Korson, Murphy, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

Various apparatuses, methods and systems for creating an integrated circuit and performing a gate level simulation of a circuit are disclosed herein. For example, some embodiments of the present invention provide a system for performing a gate level simulation of a circuit including a computer system, a design verification tool and an output device. The design verification tool, executable on the computer system, includes a simulator and a partial timing model generator. The partial timing model generator is operable to generate a representation of the circuit for simulation by cutting a first portion of a circuit out of a full gate level netlist for the circuit and leaving a second portion of the circuit represented by the full gate level netlist, and to overlay a simplified representation of the first portion of the circuit over the representation of the circuit. The first portion of the circuit is cut out at timing paths. The simulator is operable to perform a gate level simulation of the circuit based on the representation of the circuit. The output device is connected to the computer system and is operable to provide an indication of a result of the gate level simulation of the circuit.


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