The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2011

Filed:

Sep. 26, 2007
Applicants:

Chuen-der Lien, Los Altos Hills, CA (US);

Jimmy Lee, Palo Alto, CA (US);

Inventors:

Chuen-Der Lien, Los Altos Hills, CA (US);

Jimmy Lee, Palo Alto, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/3181 (2006.01); G01R 31/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

A clock generator is disclosed that includes an array of MEMS resonators and a test circuit. The test circuit is operable at start-up to operate one or more of the MEMS resonators to generate test output and analyze the test output to determine whether the operated MEMS resonators meet test criteria. A MEMS resonator is selected that meets the test criteria and its output is used to generate an output clock signal. In addition, the test circuit is operable to analyze the output of the selected MEMS resonator and select a replacement MEMS resonator when the output of the selected MEMS resonator no longer meets the test criteria. The replacement MEMS resonator is then operated and its output is coupled to the output of the clock generator. Thereby, failing and potentially failing MEMS resonators are automatically replaced during operation of the clock generator in its end-use application.


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