The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2011
Filed:
Mar. 07, 2006
Zaifu Zhang, Austin, TX (US);
Robert Bailey, Austin, TX (US);
Zaifu Zhang, Austin, TX (US);
Robert Bailey, Austin, TX (US);
Freescale Semiconductor, Inc., Austin, TX (US);
Abstract
A method and system for testing an electronic device is disclosed. The method includes loading a first test into a test pattern generator of a first device and generating a first test pattern at the test pattern generator. A second test seed is loaded into the test pattern generator while the first test pattern is being generated. In one embodiment, the state of the test pattern generator is modified based upon the second test seed, and the first test seed.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile