The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2011
Filed:
Oct. 15, 2008
Yair Sarig, San Mateo, CA (US);
Benoit Dageville, Foster City, CA (US);
Marcus Fallen, Belmont, CA (US);
Ajith Kumar Mysorenagarajarao, San Mateo, CA (US);
Mark Ramacher, San Carlos, CA (US);
Yair Sarig, San Mateo, CA (US);
Benoit Dageville, Foster City, CA (US);
Marcus Fallen, Belmont, CA (US);
Ajith Kumar Mysorenagarajarao, San Mateo, CA (US);
Mark Ramacher, San Carlos, CA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
Techniques for gathering information during runtime of a monitored system such that the information is available for facilitating diagnostics for the monitored system. In one embodiment, upon detection of a condition (such as an error condition) in the monitored system, a portion of the gathered information provides contextual information that facilitates gathering of diagnostic data that is relevant for the detected condition. This facilitates capturing of diagnostic data that is relevant for diagnosing the detected condition. The information gathered and stored during runtime may include information related to local variables, information related to tagged information (e.g., tagged functions/processes) executing in the monitored system, information related to potential impacts to the monitored system due to failures, metadata information, and other information.