The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2011

Filed:

Nov. 20, 2006
Applicant:

Atsushi Ogino, Kodaira, JP;

Inventor:

Atsushi Ogino, Kodaira, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/16 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a measurement system that comprises plural measurement devices classified by groups, and plural data processing devices on a network that receives and processes measured data from the measurement devices, the data processing devices are smoothly allocated. The measurement devices belong to groups based on the areas in which they are located, and respectively transmit measured data to a multicast address defined for each of the groups to which they belong. A management device detects an overloaded or failed data processing device, stops data processing on a multicast address at which the data processing device receives data, alternatively commands another less loaded data processing device to join the multicast group, receive measured data transmitted to the multicast address, and process the data.


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