The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2011

Filed:

Sep. 26, 2007
Applicants:

John V. Sichi, Half Moon Bay, CA (US);

Benny T. Chow, Fremont, CA (US);

Vishwas S. Agashe, San Ramon, CA (US);

Chetan R. Kadam, San Francisco, CA (US);

Quoc T. Tran, Mountain View, CA (US);

Ken M. Rudin, Palo Alto, CA (US);

Inventors:

John V. Sichi, Half Moon Bay, CA (US);

Benny T. Chow, Fremont, CA (US);

Vishwas S. Agashe, San Ramon, CA (US);

Chetan R. Kadam, San Francisco, CA (US);

Quoc T. Tran, Mountain View, CA (US);

Ken M. Rudin, Palo Alto, CA (US);

Assignee:

Pentaho Corporation, Orlando, FL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of processing data is disclosed. A data field change is detected in a received data entry received by a business intelligence application. A shared metadata entry shared by two or more business intelligence application stack elements is processed to derive for each of at least a subset of said two or more business intelligence application stack elements a corresponding set of element specific metadata needed by that element to use a data value associated with the data field change.


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