The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7941296 B1

PDF
Full Text
Expired
Date of Patent:
May. 10, 2011

Filed:

Dec. 21, 2007
Applicants:

Ronald M. Fluegge, The Colony, TX (US);

Richard B. Jones, The Woodlands, TX (US);

Inventors:

Ronald M. Fluegge, The Colony, TX (US);

Richard B. Jones, The Woodlands, TX (US);

Assignee:

HSB Solomon Associates, LLC, Dallas, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01); G06F 17/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

A computer-implemented method is provided for creating a peer unit and comparing that peer unit to a target unit in order to determine the difference in performance between the target unit and a peer unit. The peer unit is a hypothetical construct of user-defined performance variables whose values are determined based on outstanding performing units in a user-defined group. This comparison allows the user to assess what parameters of the target unit should be changed in order to improve overall performance.


Find Patent Forward Citations

Fluegge, Ronald. (2011). Benchmarking and gap analysis system and method (U.S. Patent No. 7941296). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7941296

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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