The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2011
Filed:
May. 21, 2007
Jenq-neng Hwang, Bellevue, WA (US);
Jeffrey D. Mitton, Bellevue, WA (US);
Jenq-Neng Hwang, Bellevue, WA (US);
Jeffrey D. Mitton, Bellevue, WA (US);
Nanostring Technologies, Inc., Seattle, WA (US);
Abstract
Methods, computers, and computer program products for detecting the presence of a probe within a sample overlayed on a substrate are provided. The probe comprises a plurality of spatially arranged labels. A data storage module stores a plurality of light images, where each light image has light from the sample at a corresponding wavelength range in a plurality of different wavelength ranges. A label identification module identifies a plurality of labels in the plurality of light images that are proximate to each other on the substrate. A spatial order of the plurality of labels determines a string sequence of the plurality of labels. A probe identification module determines whether the string sequence of the plurality of labels comprises a valid reporter sequence.