The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7940862 B1

PDF
Full Text
Expired
Date of Patent:
May. 10, 2011

Filed:

Jan. 03, 2008
Applicants:

Yoshinori Tanaka, Kawasaki, JP;

Hideo Miyazawa, Inagi, JP;

Inventors:

Yoshinori Tanaka, Kawasaki, JP;

Hideo Miyazawa, Inagi, JP;

Assignees:

Fujitsu Limited, Kawasaki, JP;

Fujitsu Frontech Limited, Inagi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 27/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A data decoding method judges a signal state where there is a transition from a low level to a high level or from a high level to a low level at the center portion of a bit interval as logical '1' or '0', and a signal state where a low level continues or a high level continues over the entire bit interval as logical “0” or “1”. The method has the steps of: measuring a first time duration in which the bit series signal transitions from a low level to the next low level, measuring a second time duration in which the bit series signal transitions from a high level to the next high level, and deciding a logical “0” or “1” value for the target bit to be decided based on the combination of the first time duration and the second time duration measured for the target bit.


Find Patent Forward Citations

Tanaka, Yoshinori. (2011). Data decoding method and data decoding device employing same (U.S. Patent No. 7940862). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7940862

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