The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2011

Filed:

Jul. 27, 2007
Applicants:

Alan Coady, Kanata, CA;

Zixiong Wang, Kanata, CA;

Inventors:

Alan Coady, Kanata, CA;

Zixiong Wang, Kanata, CA;

Assignee:

PMC-Sierra US, Inc., Sunnyvale, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Delay measurement and delay calibration methods and apparatus are described for use within distributed wireless base stations employing a remote radio head topology. The methods and apparatus are usable in any system that requires accurate delay measurement and/or constant delay through an electronic device. The methods and apparatus for measuring delay embody a highly accurate distributed delay measurement architecture that handles multiple delay paths within distributed wireless base stations employing a remote radio head topology. The method and apparatus are amenable to implementation with current integrated circuit technology. The methods and apparatus for calibrating electronic delay within distributed base stations employing a remote radio head topology are useful for implementing distributed wireless base stations where transmit diversity is desired. Using the methods disclosed herein, delay within a distributed wireless base station can be measured and calibrated to achieve very deterministic delay characteristics at the system level.


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