The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2011

Filed:

Jan. 14, 2004
Applicants:

Myron J. Buer, Gilbert, AZ (US);

Douglas D. Smith, Mesa, AZ (US);

Inventors:

Myron J. Buer, Gilbert, AZ (US);

Douglas D. Smith, Mesa, AZ (US);

Assignee:

Broadcom Corporation, Irvine, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 17/18 (2006.01); G11C 17/00 (2006.01); G11C 7/00 (2006.01); G11C 17/16 (2006.01); G11C 17/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to a method and circuit for verifying the state of a gated fuse element used with a one-time programmable CMOS memory device. A first expected state is set and a state of a first gate-ox fuse is sensed. The state of the first gate-ox fuse is compared to the first expected state to determine if they are equal, and a first signal is generated. A second expected state is set and a state of a second gate-ox fuse is sensed. The state of the second gate-ox fuse is compared to the second expected state to determine if they are equal, and a second signal is generated. A valid output is generated if both the first and second signals are in a correct state, both signals are high for example.


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