The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2011

Filed:

Oct. 13, 2005
Applicants:

Patric Ljung, Linköping, SE;

Anders Ynnerman, Norrköping, SE;

Inventors:

Patric Ljung, Linköping, SE;

Anders Ynnerman, Norrköping, SE;

Assignee:

Sectra AB, Linkoping, SE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 17/00 (2006.01); G06T 15/00 (2011.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to a solution for processing source data into target data. A rim distance (δ) between the block sample boundary (β) and the block edge (b) is relatively short for a comparatively high resolution level (r3), and the rim distance (δ) is relatively long for a comparatively low resolution level (rO). In connection with the production of the target data (D) at least one interpolation parameter (ρ, e(P)) is determined for at least one interpolated sample between a first block (B2) neighboring a second block (B3) at least based on a first rim distance (δ2) of the first block (B2) and a second rim distance (δ) of the second block (B3).


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