The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7940071 B1

PDF
Full Text
Expired
Date of Patent:
May. 10, 2011

Filed:

Oct. 13, 2006
Applicant:

Shingo Sakai, Kanagawa, JP;

Inventor:

Shingo Sakai, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2006.01); G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A semiconductor device is provided. The semiconductor devices includes a first and second differential pair to which first and second differential input signals are input. The first and second differential pairs are connected to N (N is an integer greater than 1) current sources through N switch pairs. Switches on one side of said N switch pairs are each connected at one end thereof to one of the N current sources and each of the switches on the one side of said N switch pairs are commonly connected at the other end thereof to the first or the second differential pairs. Control signals are connected to control terminals of said N switch pairs, so that a pattern is applied to the N switch pairs. The operation of the current sources can be confirmed by a functional test based on output values from the first and second differential pairs.


Find Patent Forward Citations

Sakai, Shingo. (2011). Semiconductor device and a method of testing the same (U.S. Patent No. 7940071). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7940071

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