The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2011
Filed:
Aug. 25, 2008
Akihiro Takahashi, Tomiya, JP;
Hidetaka Fukazawa, Miyakoto, JP;
Akihiro Takahashi, Tomiya, JP;
Hidetaka Fukazawa, Miyakoto, JP;
Freescale Semiconductor, Inc., Austin, TX (US);
Abstract
A method for measuring an on resistance in an H-bridge including first and second transistors connected to a first output terminal, third and fourth transistors connected to a second output terminal, and a measurement switch connected to the first and second output terminals. The first and third transistors are connected to a first power supply terminal. The second and fourth transistors are connected to a second power supply terminal. The method includes supplying the first transistor with measurement current during a first period, measuring a first voltage at the first power supply terminal via the third transistor using the second output terminal during the first period, measuring a second voltage at the first output terminal via the measurement switch using the second output terminal during the first period, and determining the on resistance of the first transistor based on the measurement current, first voltage, and second voltage.