The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2011
Filed:
Jan. 07, 2009
Takumi Yanagisawa, Tokyo, JP;
Takumi Yanagisawa, Tokyo, JP;
TDK Corporation, Tokyo, JP;
Abstract
A method for testing an MR element includes a step of obtaining a ferromagnetic resonance frequency fof the MR element to be tested by applying an external magnetic field in a track-width direction to the MR element, a step of calculating a stiffness magnetic field Hfrom the obtained ferromagnetic resonance frequency fusing a predetermined formula, a step of obtaining a relationship of a stiffness magnetic field Hwith respect to an external magnetic field applied in the track-width direction from the applied external magnetic field and the calculated stiffness magnetic field H, a step of obtaining a uniaxial anisotropic magnetic field Hof a free layer of the MR element from the obtained relationship of the stiffness magnetic field Hwith respect to the external magnetic field applied, and a step of judging whether the MR element is good product or not by comparing the obtained uniaxial anisotropic magnetic field Hwith a predetermined threshold.