The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 03, 2011
Filed:
Dec. 20, 2006
Applicant:
Jun-hyun Chun, Gyeonggi-do, KR;
Inventor:
Jun-Hyun Chun, Gyeonggi-do, KR;
Assignee:
Hynix Semiconductor Inc., Ichon-shi, KR;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G11C 7/00 (2006.01); G01R 35/00 (2006.01); G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract
Disclosed are a semiconductor memory apparatus and a method of testing the same. The semiconductor memory apparatus includes memory banks, each of which includes a plurality of memory cells, a peripheral circuit unit that includes a plurality of circuit groups around the memory banks, and a noise generating block that is disposed in the peripheral circuit unit and selectively applies a noise to the memory banks in a test mode.