The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2011

Filed:

Oct. 15, 2008
Applicants:

Mark Ramacher, San Carlos, CA (US);

Gary Ngai, Saratoga, CA (US);

Benoit Dageville, Foster City, CA (US);

Karl Dias, Foster City, CA (US);

Yair Sarig, San Mateo, CA (US);

Marcus Fallen, Belmont, CA (US);

Ajith Kumar Mysorenagarajarao, San Mateo, CA (US);

John Beresniewicz, San Mateo, CA (US);

Mike Feng, San Mateo, CA (US);

Jonathan Klein, Redwood City, CA (US);

Hailing Yu, Sunnyvale, CA (US);

Leng Tan, Sunnyvale, CA (US);

Balasubrahmanya Kuchibhotla, San Ramon, CA (US);

Uri Shaft, Castro Valley, CA (US);

Venkateshwaran Venkataramani, Sunnyvale, CA (US);

Amir Valiani, San Jose, CA (US);

Inventors:

Mark Ramacher, San Carlos, CA (US);

Gary Ngai, Saratoga, CA (US);

Benoit Dageville, Foster City, CA (US);

Karl Dias, Foster City, CA (US);

Yair Sarig, San Mateo, CA (US);

Marcus Fallen, Belmont, CA (US);

Ajith Kumar Mysorenagarajarao, San Mateo, CA (US);

John Beresniewicz, San Mateo, CA (US);

Mike Feng, San Mateo, CA (US);

Jonathan Klein, Redwood City, CA (US);

Hailing Yu, Sunnyvale, CA (US);

Leng Tan, Sunnyvale, CA (US);

Balasubrahmanya Kuchibhotla, San Ramon, CA (US);

Uri Shaft, Castro Valley, CA (US);

Venkateshwaran Venkataramani, Sunnyvale, CA (US);

Amir Valiani, San Jose, CA (US);

Assignee:

Oracle International Corporation, Redwood Shores, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A diagnosability system for automatically collecting, storing, communicating, and analyzing diagnostic data for one or more monitored systems. The diagnosability system comprises several components configured for the collection, storage, communication, and analysis of diagnostic data for a condition detected in monitored system. The diagnosability system enables targeted dumping of diagnostic data so that only diagnostic data that is relevant for diagnosing the condition detected in the monitored system is collected and stored. This in turn enables first failure analysis thereby reducing the time needed to resolve the condition detected in the monitored system.


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