The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2011

Filed:

Nov. 27, 2007
Applicants:

Dileep George, Menlo Park, CA (US);

Jeffrey C Hawkins, Atherton, CA (US);

Robert Gilchrist Jaros, San Francisco, CA (US);

Inventors:

Dileep George, Menlo Park, CA (US);

Jeffrey C Hawkins, Atherton, CA (US);

Robert Gilchrist Jaros, San Francisco, CA (US);

Assignee:

Numenta, Inc., Redwood City, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06E 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An HTM node learns a plurality of groups of sensed input patterns over time based on the frequency of temporal adjacency of the input patterns. An HTM node receives a new sensed input, the HTM node assigns probabilities as to the likelihood that the new sensed input matches each of the plurality of learned groups. The HTM node then combines this probability distribution (may be normalized) with previous state information to assign probabilities as to the likelihood that the new sensed input is part of each of the learned groups of the HTM node. Then, as described above, the distribution over the set of groups learned by the HTM node is passed to a higher level node. This process is repeated at higher level nodes to infer a cause of the newly sensed input.


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