The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2011

Filed:

Sep. 29, 2006
Applicants:

Ryuichi Tohma, Akashi, JP;

Hideyuki Higuchi, Kobe, JP;

Masanori Nakaya, Kobe, JP;

Inventors:

Ryuichi Tohma, Akashi, JP;

Hideyuki Higuchi, Kobe, JP;

Masanori Nakaya, Kobe, JP;

Assignee:

Sysmex Corporation, Kobe, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A sample imaging apparatus comprising: a sample image obtainer for obtaining an image of a sample smeared on a sample holder, the sample holder comprising an identification part which comprises identification information of the sample; an identification detector for detecting the identification information; an identification part image obtainer for obtaining an identification part image comprising an image of at least a portion of the identification part; an output device; and a controller for controlling the output device, such that the image of the sample and the identification part image are output when the identification detector can not detect the identification information is disclosed. A sample analyzing system, a sample analyzing apparatus, and a sample imaging method are also disclosed.


Find Patent Forward Citations

Loading…