The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2011

Filed:

Nov. 07, 2008
Applicants:

Thomas J. Barnard, Liverpool, NY (US);

Thomas M. Canavan, Syracuse, NY (US);

Inventors:

Thomas J. Barnard, Liverpool, NY (US);

Thomas M. Canavan, Syracuse, NY (US);

Assignee:

Lockheed Martin Corporation, Bethesda, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 3/16 (2006.01); H01Q 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

This invention relates to the use of a sufficiently-sampled auxiliary array in combination with one or more under-sampled sub-arrays. The sufficiently-sampled auxiliary array is used to create a signal-free reference (SFR) beam that contains grating lobe interference. The SFR may be used to cancel the interfering grating lobe in an under-sampled main beam by coherently eliminating or subtracting the SFR from the main beam. Exemplary aspects of the invention thus support significant under population of the full aperture and avoid the problems and limitations of previous solution, with consequent savings in sensor hardware cost and weight.


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