The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2011

Filed:

Jul. 21, 2008
Applicants:

Yijun Huang, Pleasantville, NY (US);

Tetsuyoshi Royama, Montvale, NJ (US);

Alexandre Kotchkin, Ridgewood, NJ (US);

Inventors:

Yijun Huang, Pleasantville, NY (US);

Tetsuyoshi Royama, Montvale, NJ (US);

Alexandre Kotchkin, Ridgewood, NJ (US);

Assignee:

Topcon Medical Systems, Inc., Oakland, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed are method and apparatus for characterizing the retinal nerve fiber layer (RNFL). An advantageous diagnostic parameter for characterizing the RNFL is a function of the product of the local RNFL thickness at a measurement locus×the distance of the measurement locus from a base point. The value of the diagnostic parameter in a patient's retina is compared to a corresponding reference range acquired from a population of healthy retinas.


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