The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 03, 2011
Filed:
Jul. 24, 2007
Mark J. Mckenna, White River Junction, VT (US);
Joseph S. Heyman, Williamsburg, VA (US);
Mark J. McKenna, White River Junction, VT (US);
Joseph S. Heyman, Williamsburg, VA (US);
Luna Innovations Incorporated, Roanoke, VA (US);
Abstract
A material characteristic measurement approach measures an internal state of a material by measuring the nonlinear shift in velocity induced by different acoustic energies. The technology for implementing this measurement approach is relatively simple, robust, permits portable measurements, does not require that an unloaded initial condition of the material be measured or otherwise known in order to determine a characteristic of the material, can be applied using one or more transducers, and does not require physical contact with the material. Some example material characteristics include a residual stress existing without any external mechanical force applied, applied stress, a fatigue state, age, an interference-fit fastener stress, bio-activity, a nanostructure mixture of the material, a heat treatment of the material, a cross-linking of polymers in the material, a bio-growth organization of the material, a clotting factor of blood or blood-like material, a cure of an adhesive or sealant material, or the microstructure of the material.