The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2011
Filed:
Jul. 27, 2007
Sara H. Basson, White Plains, NY (US);
Sarah L. Conrod, Sydney, CA;
Dimitri Kanevsky, Ossining, NY (US);
Edward E. Kelley, Wappingers Falls, NY (US);
Giridharan R. Iyengar, Nanuet, NY (US);
Sara H. Basson, White Plains, NY (US);
Sarah L. Conrod, Sydney, CA;
Dimitri Kanevsky, Ossining, NY (US);
Edward E. Kelley, Wappingers Falls, NY (US);
Giridharan R. Iyengar, Nanuet, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Using metadata to detect alteration of data. A first set of metadata characteristics including at least one respective semantic description are recorded for a first set of data representing original data. A second set of metadata characteristics including at least one corresponding semantic description are recorded for a second set of data representing data under test. The first and second sets of metadata characteristics are compared. If the first and second sets of metadata characteristics are not identical, these sets are processed to identify locations in the first set of data that have been altered. Using the at least one semantic description for the first set of data and the at least one corresponding semantic description for the second set of data, one or more metadata characteristics that have changed from the first set of data to the second set of data are identified.