The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2011
Filed:
Jun. 04, 2008
Jinsoup Joung, Seongnam, KR;
Seunghwan Ji, Seongnam, KR;
Junwan Park, Seoul, KR;
Jahon Koo, Seoul, KR;
Jinsoup Joung, Seongnam, KR;
Seunghwan Ji, Seongnam, KR;
Junwan Park, Seoul, KR;
Jahon Koo, Seoul, KR;
Innowireless Co., Ltd., Seongnam, KR;
Abstract
Disclosed herein is a dual processing system capable of ensuring real-time processing in a protocol conformance test. A protocol testing device performs a test on a layer under protocol test provided in a device under test. A communication device processes the protocol of a layer below the layer under protocol test between the device under test and the protocol testing device. The communication device processes a protocol test message, requiring real-time processing, instead of the protocol testing device, and transmits processing results for the protocol test message to the protocol testing device. The protocol testing device processes a protocol test message, not requiring real-time processing, and determines the conformance of the layer under protocol test provided in the device under test based on the processing results for the protocol test message.