The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2011

Filed:

Dec. 07, 2006
Applicants:

Kai Frank Goebel, Mountain View, CA (US);

Neil Holger White Eklund, Schenectady, NY (US);

Hai Qiu, Clifton Park, NY (US);

Weizhong Yan, Clifton Park, NY (US);

Inventors:

Kai Frank Goebel, Mountain View, CA (US);

Neil Holger White Eklund, Schenectady, NY (US);

Hai Qiu, Clifton Park, NY (US);

Weizhong Yan, Clifton Park, NY (US);

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06G 7/48 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method to estimate damage propagation is disclosed. The method includes making available a set of input parameters to a computational model, executing the computational model with defined changes within a range of an input parameter of the set of input parameters to define a range of at least one modeled output, receiving at least one signal responsive to and representative of a respective one of an actual sensor output, and estimating damage propagation based upon a correlation of the received signal to the modeled output.


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