The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2011
Filed:
Jan. 29, 2008
Toshihiko Matsuoka, Nukata-gun, JP;
Toshihiko Matsuoka, Nukata-gun, JP;
DENSO CORPORATION, Kariya, JP;
Abstract
A semiconductor integrated circuit having a test circuit for collecting test data at any time based on interaction with an external source is provided. A communication circuit receives a data frame that is transferred to a data buffer. Data portions are transferred to a test unit of a test circuit. A counter starts a count operation based on a system clock when count information is transferred. If one of the data portions indicates the transferred data is test data, and another portion indicates a data collection specification command, the test unit outputs decoded address data to interact with a circuit-under-test when the counter completes the count operation based on another portion of the frame. A data buffer is supplied with the address data to facilitate storage of the data transferred from the circuit-under-test.