The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2011
Filed:
Nov. 10, 2006
John T. Campbell, Bridgeville, PA (US);
Robert J. Mcgreevy, Oswego, IL (US);
Robert J. Herbst, Aurora, OH (US);
John J. Baier, Mentor, OH (US);
Taryl J. Jasper, South Euclid, OH (US);
John T. Campbell, Bridgeville, PA (US);
Robert J. McGreevy, Oswego, IL (US);
Robert J. Herbst, Aurora, OH (US);
John J. Baier, Mentor, OH (US);
Taryl J. Jasper, South Euclid, OH (US);
Rockwell Automation Technologies, Inc., Mayfield Heights, OH (US);
Abstract
Systems and methods that can vary a data collection rate via a rate adjustment component, to collect data with different level of granularity. The rate adjustment component can further include an estimation component that can automatically predict a required sampling rate for a stage of an operation, based on statistical models and data collected for similar operations and/or history data. Such difference in the granularity level can initiate in part in response to fault detection, alert triggering, and the like. Accordingly, future trouble shooting efforts can be performed with respect to data that is typically collected at an adjustable rate.