The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2011
Filed:
Apr. 08, 2002
Applicant:
Wolfgang Kernchen, Sauerlach, DE;
Inventor:
Wolfgang Kernchen, Sauerlach, DE;
Assignee:
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2006.01); H04Q 1/20 (2006.01);
U.S. Cl.
CPC ...
Abstract
A measuring system () comprises a signal generator (), generating a digital modulated high frequency measuring signal (MS), for supplying to the input () of a test unit (). A signal analyser () connected to the output () of the test unit (), analyses the output signal (OS) of the test unit () after a demodulation. A direct connection () is provided between the signal generator () and the signal analyser (), by means of which a reference signal (Ref) is supplied directly to the signal analyser () from the signal generator ().