The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2011
Filed:
Dec. 29, 2008
Nak Young Kim, Seoul, KR;
Pil Sang Yoon, Seoul, KR;
Kyu IL Jung, Seoul, KR;
DaeWoo Electronics Ltd., , KR;
Abstract
Provided are a method for detecting a pattern of an over-sampling image and an optical information processing apparatus and method using the same. A method for detecting a pattern from an image of an over-sampled datapage includes: over-sampling the datapage to detect a detection image of the datapage; comparing the detection image and a reference image of over-sampling for the pattern by a covariance; and calculating a pixel of the pattern over-sampled by values of the reference image and the detection image compared by the covariance. Accordingly, data with a specific pattern such as a mark can be detected from an image of an over-sampled datapage, thereby making it possible to increase the data reproduction accuracy, thus making it possible to greatly increase the reliability of reproduced optical data.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile