The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2011
Filed:
Jan. 14, 2009
Kameron Kam-wai Jung, Yorba Linda, CA (US);
Stephany W. Kwan, Rowland Heights, CA (US);
Kameron Kam-Wai Jung, Yorba Linda, CA (US);
Stephany W. Kwan, Rowland Heights, CA (US);
Western Digital Technologies, Inc., Irvine, CA (US);
Abstract
A disk drive is disclosed comprising control circuitry operable to calibrate a write current parameter. A write current is initialized to an initial write current INIT_Iw, and an overshoot is initialized to a maximum MAX_OS. The write current is swept from INIT_Iw to a maximum write current MAX_Iw while writing and reading data from a target track to measure a first quality metric. A second quality metric associated with wide track erasure is also measured. A quality of the write operations is determined in response to the first and second quality metrics. When the quality of the write operations does not exceed a threshold, at least one of the MAX_Iw and MAX_OS is decreased and the process is repeated. Otherwise, the write current is swept from a minimum write current limit MAX_Iw to the adjusted MAX_Iw for a plurality of tracks to find an optimal write current for each track.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile