The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2011

Filed:

Feb. 09, 2006
Applicants:

Sergey Sofer, Reshon Letzion, IL;

Yehim-haim Fefer, Petah Tikva, IL;

Valery Neiman, Rishon Lezion, IL;

Inventors:

Sergey Sofer, Reshon Letzion, IL;

Yehim-Haim Fefer, Petah Tikva, IL;

Valery Neiman, Rishon Lezion, IL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A device for testing noise immunity of a circuit includes: an analog circuit, an internal stable reference signal source, an internal power supply module to receive a high level voltage supply, and a signal modulator to provide a noisy signal to the power supply module. The power supply module outputs a noisy power supply to the circuit, in response to the noisy signal, and the device outputs a signal representative of a noise immunity of the circuit. A method includes: providing a high level supply voltage to an internal power supply module, receiving signals representative of the performance of an analog circuit, providing a noisy signal to an input of the power supply module, providing a noisy supply voltage to the circuit, by the power supply module, in response to the noisy signal, and evaluating a noise immunity characteristic of the circuit in response to the received signals.


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