The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2011
Filed:
May. 18, 2009
David R. Parks, San Francisco, CA (US);
Wayne Moore, San Francisco, CA (US);
Stephen Meehan, Vancouver, CA;
David R. Parks, San Francisco, CA (US);
Wayne Moore, San Francisco, CA (US);
Stephen Meehan, Vancouver, CA;
Other;
Abstract
This invention relates to the field of flow cytometry. It provides methods for identifying important dye-detector spectral overlaps for use in designing flow cytometry experiments. It further provides methods for quantifying the impact of spectral overlaps on dye selection and detector selection, the methods including the steps of: a) obtaining spectra of a dye; b) obtaining a laser configuration and an optical filter configuration of a detector; c) obtaining a spectrum yield value; and d) ranking the spectrum yield value.