The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2011

Filed:

Sep. 29, 2008
Applicants:

Sharon Xiaorong Wang, Hoffman Estates, IL (US);

John Thomas Pawlak, Villa Park, IL (US);

Govind Pai, Aurora, IL (US);

Inventors:

Sharon Xiaorong Wang, Hoffman Estates, IL (US);

John Thomas Pawlak, Villa Park, IL (US);

Govind Pai, Aurora, IL (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/166 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for optimizing the scanning trajectory of a radiation detector device, e.g., a SPECT scanning device, about an object generally includes: obtaining object image data using a different imaging modality, e.g., a CT scanning device, determining a maximum object boundary based on the image data, calculating an optimal scan trajectory of the SPECT scanning device relative to the object based on the maximum object boundary, scanning the object with the SPECT scanning device along the optimal scan trajectory to detect gamma photons emanating from the object, from which an image can be reconstructed from the detected gamma photons. Preferably, the SPECT device includes at least two detectors arranged at a pre-selected angle relative to one another and the optimal scan trajectory minimizes the distance between the detectors and the object while maximizing the geometric efficiency of the detectors relative to the object.


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