The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2011

Filed:

Oct. 31, 2002
Applicants:

Winthrop D. Childers, San Diego, CA (US);

Paul Crivelli, San Diego, CA (US);

David Tyvoll, La Jolla, CA (US);

James A. Feinn, San Diego, CA (US);

Douglas A. Sexton, La Jolla, CA (US);

Inventors:

Winthrop D. Childers, San Diego, CA (US);

Paul Crivelli, San Diego, CA (US);

David Tyvoll, La Jolla, CA (US);

James A. Feinn, San Diego, CA (US);

Douglas A. Sexton, La Jolla, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/26 (2006.01); G01N 1/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems, including apparatus and methods, for microfluidic processing and/or analysis of samples. The systems include a microfluidic device having a substrate and a thin-film layer formed on the substrate. The thin-film layer may be included in electronics formed on the substrate. The electronics may provide electronic devices configured to sense or modify a property of the sample. The thin-film layer defines an opening for routing movement of fluid and/or sample within the device.


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