The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2011
Filed:
Jun. 03, 2010
Guangming Dai, Fremont, CA (US);
Guangming Dai, Fremont, CA (US);
AMO Manufacturing USA, LLC., Santa Ana, CA (US);
Abstract
Systems, methods, and devices for determining an aberration in an optical tissue system of an eye are provided. Techniques include inputting optical data from the optical tissue system of the eye, where the optical data includes set of local gradients corresponding to a non-circular shaped aperture, processing the optical data with an iterative Fourier transform to obtain a set of Fourier coefficients, converting the set of Fourier coefficients to a set of modified Zernike coefficients that are orthogonal over the non-circular shaped aperture, and determining the aberration in the optical tissue system of the eye based on the set of modified Zernike coefficients.