The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2011
Filed:
Sep. 18, 2008
Fangzhe Chang, Edison, NJ (US);
Yangsong Ren, Basking Ridge, NJ (US);
Thomas L. Wood, Colts Neck, NJ (US);
Fangzhe Chang, Edison, NJ (US);
Yangsong Ren, Basking Ridge, NJ (US);
Thomas L. Wood, Colts Neck, NJ (US);
Alcatel-Lucent USA Inc., Murray Hill, NJ (US);
Abstract
The invention includes a method and apparatus for validating system properties exhibited in execution traces. In one embodiment, a method for testing a system under test (SUT) includes determining a system testing result for the SUT using at least one structured term generated by monitoring an execution trace of the SUT using at least one parameterized pattern. A test procedure is executed for the SUT. The test procedure has at least one parameterized pattern associated therewith. An execution trace generated during execution of the test procedure is parsed, where the execution trace includes unstructured information and the execution trace is parsed using the at least one parameterized pattern to identify at least one matching pattern. A system testing result for the SUT is determined using at least one structured term that is generated using the at least one matching pattern. In this manner, behavior of the system under test during the test procedure may be validated.