The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2011

Filed:

Mar. 14, 2008
Applicants:

Hung-yang Chang, Scarsdale, NY (US);

Jun-jang Jeng, Armonk, NY (US);

Christian A. Lang, New York, NY (US);

Inventors:

Hung-Yang Chang, Scarsdale, NY (US);

Jun-Jang Jeng, Armonk, NY (US);

Christian A. Lang, New York, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A01K 5/02 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method, information processing system, and computer readable storage medium manage and predict profit leakage. A dynamic deduction space is created that includes a plurality of dimensions associated with historical deduction data and profit leakage information associated with a combination of two or more of the dimensions. Information associated with an open deduction is received. A dimension set in the deduction space is identified that corresponds to the open deduction. A profit leakage classification is assigned to the open deduction based on profit leakage information associated with the dimension set.


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