The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2011
Filed:
Jan. 23, 2009
Takahiro Ikeda, Yokohama, JP;
Masafumi Asano, Yokohama, JP;
Takahiro Ikeda, Yokohama, JP;
Masafumi Asano, Yokohama, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Abstract
A method for evaluating a sampling inspection. The method includes determining a first and a second sampling plan, and obtaining a first and a second measured value of a production lot based on the first and the second sampling plans, respectively. The method also includes calculating a first and a second acceptance variable based on the first and second measured values, respectively, and calculating a first and second acceptance probabilities based on the first and second acceptance variables, respectively. The method further includes calculating a first and a second operating characteristic of the first and second sampling plans based on the first and second acceptance probabilities, respectively, and evaluating the first and the second operating characteristics.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile