The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2011

Filed:

Oct. 22, 2004
Applicants:

Changsoo Je, Seoul, KR;

Sang Wook Lee, Seoul, KR;

Inventors:

Changsoo Je, Seoul, KR;

Sang Wook Lee, Seoul, KR;

Assignees:

Nano Picture Co., Ltd., Seoul, KR;

Sogang University, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for generating a structured-light pattern is disclosed, wherein high-resolution real-time three-dimensional (3D) data can be obtained by using a single frame (or one-shot) imaging or double frames (or two-shot) imaging methods. The structured-light pattern for the one-shot imaging is formed of a multiple-stripe color pattern using a color selection scheme and a sequence principle. The proposed color selection scheme reduces the ambiguity in stripe labeling in one-shot imaging, and the proposed sequence principle increases the number of distinguishable stripe codes. The structured-light pattern for two-shot imaging is formed so that three-dimensional (3D) data can be obtained even for objects having strong surface colors with ambient lights, wherein the first two-shot pattern is synthesized, thereby forming a multiple-stripe color pattern using sign codes and a sequence principle under a condition that prevents color-transitions in more than one channels from occurring. Subsequently, the second two-shot pattern is formed by reversing the first two-shot pattern. Accordingly, high-resolution real-time three-dimensional (3D) data, which is insensitive to object shape and surface color, system noise and nonlinearity, can be obtained.


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