The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2011

Filed:

Sep. 20, 2006
Applicants:

Saad Ahmed Sirohey, Pewaukee, WI (US);

Gopal B. Avinash, New Berlin, WI (US);

Tamanna Bembenek, Milwaukee, WI (US);

Inventors:

Saad Ahmed Sirohey, Pewaukee, WI (US);

Gopal B. Avinash, New Berlin, WI (US);

Tamanna Bembenek, Milwaukee, WI (US);

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and systems for automatically generating a severity index for images of anatomical features of a patient are provided. In an exemplary embodiment, an image of an anatomical feature of a patient is compared with a normal, standardized image of the same anatomical feature. Based on this comparison, a deviation image for the anatomical feature is generated that represents the degree and manner the acquired image deviates from normal for that anatomical feature. The deviation image is automatically pattern matched against multiple images of known disease severity for the anatomical feature. Based on the automated pattern match, a known disease severity, such as in the form of a severity index, is provided as corresponding anatomical feature for the patient.


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