The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2011

Filed:

Sep. 29, 2009
Applicants:

Yong Cheol Park, Gwachon-si, KR;

Sung Dae Kim, Gunpo-si, KR;

Inventors:

Yong Cheol Park, Gwachon-si, KR;

Sung Dae Kim, Gunpo-si, KR;

Assignee:

LG Electronics Inc., Seoul, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A write-once optical recording medium, a method for allocating a defect management area of the write-once optical recording medium, and a method for allocating a spare area of the write-once optical recording medium are provided. A method of managing defects on a write-once optical recording medium having at least one recording layer includes the steps of allocating at least one temporary defect management area having a fixed size and at least one temporary defect management area having a variable size to said optical recording medium, respectively, recording defect management information on the at least one temporary defect management area having a fixed size and the at least one temporary defect management area having a variable size; and using the at least one temporary defect management area having a fixed size and the at least one temporary defect management area having a variable size is provided herein.


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