The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2011
Filed:
Dec. 12, 2007
Takashi Kikukawa, Tokyo, JP;
Koji Mishima, Tokyo, JP;
Hidetake Itoh, Tokyo, JP;
TDK Corporation, Tokyo, JP;
Abstract
When there is a defect area in a specific recording layer, recording of information is continued to restrain reduction in a recording rate. In an optical recording method for recording information on a multilayer optical recording medium having a plurality of recording layers by irradiating the recording layer with a beam spot, when a defect area is detected while the information is recorded on a specific recording layer selected from the plurality of recording layers, an escape recording layer which is selected from among the other recording layers except for the specific recording layer is irradiated with the beam spot to continue recording the information.