The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2011

Filed:

Jul. 15, 2008
Applicants:

Moshe Ben-ezra, Beijing, CN;

Yasuyuki Matsushita, Beijing, CN;

Bennett S Wilburn, Beijing, CN;

Xiaoyang LI, Ithaca, NY (US);

Inventors:

Moshe Ben-Ezra, Beijing, CN;

Yasuyuki Matsushita, Beijing, CN;

Bennett S Wilburn, Beijing, CN;

Xiaoyang Li, Ithaca, NY (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2006.01);
U.S. Cl.
CPC ...
Abstract

Photodiode-based bi-directional reflectance distribution function (BRDF) measurement is described. Multiple photodiodes are distributed approximately symmetrically at a fixed distance from a surface to be measured. One or more of the photodiodes are directed to emit light, while readings are gathered from the other photodiodes that are not emitting light. The readings are processed based on previously measured calibration data to generate BRDF values.


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