The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2011
Filed:
May. 05, 2010
Koichi Nakano, Hyogo, JP;
Yasuhiro Hayashi, Hyogo, JP;
Koichi Nakano, Hyogo, JP;
Yasuhiro Hayashi, Hyogo, JP;
Hokuto Electronics Incorporated, Nishinomiya, JP;
Abstract
The size of particles is detected accurately and at low cost even when there are few microparticles as impurities included in a liquid. Provided is a method of detecting a size of particles in a liquid by detecting diffraction fringes appearing due to the particles in the liquid by a light detection portion. Diffraction fringes are detected by a first light detection portion and a second light detection portion that are separated along the flow direction of the liquid. A peak time difference (T) that is a difference between times at which peak values appear in a detection signal from the first and second light detection portion is measured, and an area (SQ) based on the waveform of the detection signal is measured. The sizes of the particles included in the liquid are detected based on the peak time differences (T) and the areas (SQ) that were measured.