The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2011
Filed:
Jul. 10, 2009
John Mark Lupton, Salt Lake City, UT (US);
Michael H. Bartl, Salt Lake City, UT (US);
Debansu Chaudhuri, Salt Lake City, UT (US);
Jeremy Galusha, Arlington, VA (US);
Nicholas Borys, Salt Lake City, UT (US);
Manfred Josef Walter, Unterfoehring, DE;
John Mark Lupton, Salt Lake City, UT (US);
Michael H. Bartl, Salt Lake City, UT (US);
Debansu Chaudhuri, Salt Lake City, UT (US);
Jeremy Galusha, Arlington, VA (US);
Nicholas Borys, Salt Lake City, UT (US);
Manfred Josef Walter, Unterfoehring, DE;
University of Utah Research Foundation, Salt Lake City, UT (US);
Abstract
Systems and methods for performing transmission microscopy on a sample material are disclosed. The sample material is placed on a metal nanoparticle substrate. High intensity light, such as an infrared laser, is focused on the nanoparticle substrate, thereby exciting the silver nanoparticles. The excited nanoparticles emit intensely focused, spectrally broad white light that is able to pass through the sample material without significant scattering even when the sample material is highly diffuse. The emitted light that passes through the sample material is detected and used to generate images and characterize features of the sample material, including the internal structural composition of the sample material.