The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2011

Filed:

Mar. 01, 2007
Applicants:

Sang Jun Lee, Jeollanam-Do, KR;

Young Gil Kim, Suwon-Si, KR;

Inventors:

Sang Jun Lee, Jeollanam-Do, KR;

Young Gil Kim, Suwon-Si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A display device testing system and a method for testing a display device using the same, which are capable of testing whether a display panel is defective or not according to a variation of the frame frequency and whether the driver module operates normally or not even at a voltage higher than a normal operation voltage. The display device testing system includes a display panel including a plurality of gate lines; a driver module including a gate driver unit for sequentially supplying a gate voltage to the plurality of gate lines in response to a test, vertical synchronization start signal; and a testing module for supplying a test vertical synchronization start signal to the driver module.


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