The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2011
Filed:
Oct. 26, 2007
Joachim Zach, Oestringen, DE;
Joachim Zach, Oestringen, DE;
CEOS Corrected Electron Optical Systems GmbH, Heidelberg, DE;
Abstract
The invention concerns a phase plate for electron optical imaging, wherein the zero beam () is phase-shifted in order to obtain an image with optimum contrast through interference with the diffracted electron beams (). The shading of diffracted electron beams () is kept to a minimum and shading that cannot be reconstructed from the obtained image data is prevented. This is achieved in that the electrode () is designed as a shielded conductor (), which is disposed to extend from a mounting () in a substantially radial direction towards the area of the zero beam (), wherein the shielded conductor () has an end () in front of the area of the zero beam () such that a field () is formed between the conductor () and the shielding () surrounding it, which overlaps this area. The invention also concerns an imaging method for complete reconstruction of the image and an electron microscope () which is provided with the phase plate ().