The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2011

Filed:

May. 02, 2008
Applicant:

Juergen Dehler, Forchheim, DE;

Inventor:

Juergen Dehler, Forchheim, DE;

Assignee:

Ziehm Imaging GmbH, Nuremberg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Embodiments of an X-ray diagnostic imaging system comprise a plurality of coded 2D and/or 3D markers associated with surfaces of system components. The position and coding of at least some of the coded markers can be determined by a position detection system. In some embodiments, a coded marker is assigned a reference point having a known position on the surface of the system component. The positions of the system components in space can be calculated based at least in part on a reference point network determined from the position of the individual reference points measured with the position detection system. In some embodiments, the coded markers represent information with a data matrix code (DMC).


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