The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2011

Filed:

Nov. 20, 2008
Applicants:

William E. Shaw, Marlborough, MA (US);

Michael E. Deflumere, Winchester, MA (US);

Brian Foley, Nashua, NH (US);

Walter P Watson, Lowell, MA (US);

Inventors:

William E. Shaw, Marlborough, MA (US);

Michael E. DeFlumere, Winchester, MA (US);

Brian Foley, Nashua, NH (US);

Walter P Watson, Lowell, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 23/16 (2006.01);
U.S. Cl.
CPC ...
Abstract

A telescope design is disclosed that has at least some of its interior facing surfaces configured with corner reflectors, so that a detector operatively coupled to the telescope views itself, instead of those surfaces. The corner reflectors may be on, for example, interior facing surfaces of a conventional baffle appended to the telescope and/or mirror supports or other structures inside the telescope housing that are within the detector's FOV. Likewise, the corner reflectors may be on interior facing surfaces of a baffle that is integrated into the telescope housing. In some such cases, the integrated baffle can be configured as both a baffle and a mirror support. The integrated baffle can be shaped to the F-cone between mirrors of a given telescope design, and/or configured to minimize or otherwise reduce the total obscuration of the baffle to improve the optical throughput.


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